Seach This Blog
Tag Cloud
AOI Baking BGA Burn/In(B/I) Carrier Component drop/detachment Concept DFx EDX/EDS/SEM ENIG FATP Flux FVT Gold HASL HIP(Head-In-Pillow) HotBar ICT IMC LCM LTS Manufacturing glossary metal dome MFI newbie NWO(Non-Wet-Open) OSP Oxidation Panel & De-panel PIH Popcorn-Effect Problem analysis & solving PTF Red Dye Penetration Reliability Solder broken crack Soldering Solder paste Stencil Temperature Profile Troubleshooting V-cut Warpage Wave-soldering X-raySponsor
Categories
Bookmarks
Histats
Statcounter
Email Subscription
Category Archives: Uncategorized
Mar21
Electronic Product Burn-In and Run-In: What They Are and Their Pros & Cons
In the early days, when electronic component design and manufacturing were still in their infancy, burn-in (B/I) was widely used to screen out defective products. This process helped eliminate early failures before products reached customers, reducing the risk of complaints. … Continue reading