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Category Archives: EDX/EDS/SEM/IMC/FTIR
Jul10
Customer Complaint About Oil Contamination on PCB: Who’s the Real Culprit? (FTIR Analysis)
In the previous article, Workingbear mentioned a serious DOA (Dead on Arrival) customer complaint involving one of the company’s products. Most of the defective units had unresponsive keypads—specifically the 3, 6, and 9 buttons—and it was eventually traced back to … Continue reading
Jul03
[Case Study] Troubleshooting a Customer Complaint – Keypad Malfunction Caused by Oil & Powder Contamination on the PCB
This article shares a real case from Workingbear’s past experience dealing with an urgent customer complaint. One day, Workingbear was suddenly assigned to fly to a factory in China to “hunt for oil.” My manager even warned, “If you don’t … Continue reading
Jun19
What Is EDX/EDS? A Beginner’s Guide to Elemental Analysis in Materials Science
Energy-Dispersive X-ray Spectroscopy (EDS or EDX) is a common, non-destructive technique used in the industry to quickly identify the elemental composition of a sample’s surface. In electronics manufacturing and material analysis, knowing what elements are present is critical for quality … Continue reading
May29
Uncovering the Culprit: How CAF Turned Out to Be the Hidden Cause Behind PCB Micro-Shorts — From Suspicion and Analysis to Solutions
Workingbear’s company was having a tough time with a strange issue: intermittent micro-short circuits inside the layers of the PCB. Since the shorts didn’t show up near any components, it was really hard to figure out what was wrong. Recently, … Continue reading
Apr30
Understanding the EDX Report: Can EDX Be Used to Estimate a Sample’s Chemical Formula?
Workingbear has noticed that many people still have questions about EDX/EDS elemental analysis reports. This is the second article where he tries to provide answers based on his knowledge. EDX (Energy-Dispersive X-ray Spectroscopy), also known as EDS, is actually an … Continue reading