Seach This Blog
Tag Cloud
Baking BGA CAF Carrier Component drop/detachment Concept Contamination Cpk DFx Discoloration ECM (Electrochemical migration) ENIG FATP Fishbone Flux FVT Glossary Gold HASL HIP(Head-In-Pillow) ICT IMC Manufacturing glossary MFI newbie NWO(Non-Wet-Open) OSP Panel & De-panel PLC Problem analysis & solving Red Dye Penetration Reliability Short circuit small-talk Solder broken crack Soldering Solder paste Stencil Temperature Profile Troubleshooting V-cut Video/Youtube Warpage Wave-soldering X-raySponsor
Categories
- Case study
- Connector
- Corrugated Paper
- Design
- EDX/EDS/SEM/IMC/FTIR
- Fundamental Science
- Glue/adhesive/epoxy/underfill,
- Keypad
- Management
- Manufacture
- Moisture Sensitive
- PCB/FPC/PTF
- Personal Opinion
- Plastic
- Process
- Product Introduction
- Quality
- Reliability
- Role & Responsibility
- SMT
- Soldering
- SPC
- Test/Inspection
- Uncategorized
Bookmarks
Histats
Statcounter
Email Subscription
Category Archives: Reliability
Sep02
BGA Red Dye Penetration Test: Acceptance Criteria for Cracks and Voids
Figure: BGA Red Dye Penetration Test: Acceptance Criteria for Cracks and Voids A reader asked Workingbear, “After performing a Red Dye Penetration / Red & Pry Test on a BGA, how should we determine the acceptance and rejection criteria?” At … Continue reading
Aug25
[Case Study] BGA Solder Ball Cracking: Strain Gauge Analysis and Design Improvement
Figcaption：BGA soldering crack analysis: Cross-Section shows crack locate at IMC location During new product development, electronics companies may encounter BGA solder ball cracking after a drop test in which the bare unit is dropped from a specified height. When this … Continue reading
Apr02
Root Cause Analysis: Why FPC Traces Break
Recently, my company started seeing an increase in field returns caused by open circuits in flexible printed circuits (FPCs) inside the terminal. After digging into several cases, the root cause turned out to be broken copper traces. So what’s going … Continue reading
Aug07
What’s the Difference Between Electromigration (EM) and Electrochemical Migration (ECM)?
At first glance, Electromigration (EM) and Electrochemical Migration (ECM) might seem alike. In both cases, metal atoms or ions move from a high-voltage area to a low-voltage area, and both can lead to dendrite growth. But they’re actually very different … Continue reading
Aug06
How to Perform Process Capability Analysis?
Process Capability refers to how well a process can produce quality products once it becomes stable. In real production, many variable factors can cause the process to fluctuate. By applying statistical methods, we can better understand how the process is … Continue reading
